Overcoming Microscopy Interference When You Can’t Find the Source of the Problem
August 27, 2019Electron microscopy is a cornerstone technique for generating high resolution images in materials science and biology research, yet environmental interference is a common problem that can affect image quality. Lawrence Berkeley National Laboratory (LBNL) is using a Spicer SC24 field cancelling system provided by VEC to help overcome these problems, and improve microscope performance.
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Cutting Edge Semiconductor Facility In An Old Building On A High Floor?
April 30, 2019Summary: A VEC site evaluation for an architectural firm helped make a challenging space work for vibration sensitive semiconductor tools for a new manufacturing program. During the site evaluation, VEC identified several sources of vibration that would be problematic for the planned toolset. These sources included the location within the building and old air handlers and facility support […]
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Spot Mode Video Used To Resolve Problem With a SEM
April 30, 2019Summary: A bioengineering company had an image disturbance on a scanning electron microscope (SEM). The company retained VEC to determine the cause of the image disturbance and either implement or recommend a solution. Using Spot Mode Video, VEC determined that an improperly mounted muffin fan located on the back panel of the SEM was the source of the disturbance. VEC implemented a temporary […]
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Cleanroom Site Evaluation – An Avoided Disaster
April 30, 2019Summary: A growing semiconductor company in the USA is evaluating a new location for its cleanroom space. The company wants to ensure that magnetic fields, acoustic noise, and vibration levels will be suitable for their sensitive tools. Vibration Engineering Consultants (VEC) completed a thorough evaluation, during various times of the day, to determine if the proposed space was conducive to […]
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Understanding the Site Survey
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