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VEC Blog

Acoustic Noise in Laboratories: Understanding the Problem & Finding Solutions

April 12, 2023

Laboratories are places where precision and accuracy are of utmost importance. Any external factor that affects the accuracy of the results can be disastrous. One such factor that often goes unnoticed is acoustic noise. The sources of acoustic noise can vary from mundane sources like air conditioning units to more complex sources like machinery[…]

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DVIA - M vs Piezoelectric Vibration Isolation Systems. Which is King?

DVIA - M vs Piezoelectric Vibration Isolation Systems. Which is King?

March 28, 2022

Overview: The Daeil DVIA-M series vibration isolations system is the premier active vibration isolation system with excellent broadband vibration isolation and superior performance at low frequencies. With dynamic feedback and feedforward controls and best-in-class components and design, the DVIA-M series outperforms other available systems,[…]

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Electron Microscope Vibration: An Increasing Issue in Today’s Laboratories

Electron Microscope Vibration: An Increasing Issue in Today’s Laboratories

June 23, 2020

Electron microscope vibration is an increasing concern in modern laboratories because of improving resolution and extended duration imaging. At higher resolution, external vibrations have a proportionally greater impact on image quality. Also, extended duration imaging and 3D reconstructions cause image quality to be more susceptible to[…]

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Active vs. Passive Vibration Isolation

Active vs. Passive Vibration Isolation

January 13, 2020

Active vs. passive vibration isolation, understanding the difference is critical to mitigating the impacts of vibration on equipment performance.  Passive isolation systems use the natural properties of a spring and a dampener to reduce vibration.  Active vibration isolation systems use a control system with integrated sensors and actuators,[…]

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What are VC-Curves, why are they useful, and how are they relevant?

What are VC-Curves, why are they useful, and how are they relevant?

January 8, 2020

Vibration Criteria Curves, or VC-Curves, are a standard way to report vibration. They are helpful because they allow users to compare vibration levels across locations using a standardized, widely accepted format. However, electron microscopes, high-tech manufacturing tools, and vibration-sensitive equipment often have different specifications[…]

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How EMI Cancellation Systems Work

How EMI Cancellation Systems Work

January 6, 2020

An EMI cancellation system cancels electromagnetic interference (EMI) that degrades electron microscopes performance.  Using a sensor, controller, and field canceling loops, the EMI cancellation system measures the ambient magnetic field at the electron beam column and then generates an equal and opposite field thereby eliminates EMI that would[…]

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EMI Interference: Understanding and Mitigating AC and DC Magnetic Fields

EMI Interference: Understanding and Mitigating AC and DC Magnetic Fields

October 17, 2019

DC and AC magnetic fields create electromagnetic interference (EMI) that can degrade the performance of electron microscopes and e-beam lithography tools.  Although AC and DC magnetic fields are related, each impacts equipment differently.  There are different strategies to mitigate both, but an AC+DC active magnetic field cancelation system is[…]

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Understanding and Mitigating Vibration In Your Facility

Understanding and Mitigating Vibration In Your Facility

August 27, 2019

Low-frequency and high-frequency vibration both have a significant impact on electron microscopy laboratories and high-tech manufacturing facilities. These two types of vibration stem from different causes and the strategy for mitigating vibration for each is also different. Vibration Engineering Consultants (VEC) can help you quantify and[…]

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Site Survey: Why Use a Third-Party?

Site Survey: Why Use a Third-Party?

July 16, 2019

When purchasing or moving a new electron microscope or process tool, customers have a few options when it comes to deciding who should provide their site survey. The original equipment manufacturer (OEM) will often offer the survey, and organizations sometimes attempt to conduct the survey themselves in-house. In this post, we will discuss the[…]

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DC Magnetic Field Disturbances on Electron Microscopes and E-Beam Lithography Tools

DC Magnetic Field Disturbances on Electron Microscopes and E-Beam Lithography Tools

January 24, 2018

Overview: Changes in DC magnetic field levels near an electron microscope or e-beam lithography tool degrade image quality and inhibit production. A change in DC fields often results in image distortion, a blurred image, or image drift. Common sources of change in DC magnetic fields are variation in the Earth’s magnetic field and the movement of[…]

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Vibration Reduction for Sensitive Instruments