Laboratories are places where precision and accuracy are of utmost importance. Any external factor that affects the accuracy of the results can be disastrous. One such factor that often goes unnoticed is acoustic noise. The sources of acoustic noise can vary from mundane sources like air conditioning units to more complex sources like machinery[…]
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Overview: The Daeil DVIA-M series vibration isolations system is the premier active vibration isolation system with excellent broadband vibration isolation and superior performance at low frequencies. With dynamic feedback and feedforward controls and best-in-class components and design, the DVIA-M series outperforms other available systems,[…]
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Electron microscope vibration is an increasing concern in modern laboratories because of improving resolution and extended duration imaging. At higher resolution, external vibrations have a proportionally greater impact on image quality. Also, extended duration imaging and 3D reconstructions cause image quality to be more susceptible to[…]
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Active vs. passive vibration isolation, understanding the difference is critical to mitigating the impacts of vibration on equipment performance. Passive isolation systems use the natural properties of a spring and a dampener to reduce vibration. Active vibration isolation systems use a control system with integrated sensors and actuators,[…]
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Vibration Criteria Curves, or VC-Curves, are a standard way to report vibration. They are helpful because they allow users to compare vibration levels across locations using a standardized, widely accepted format. However, electron microscopes, high-tech manufacturing tools, and vibration-sensitive equipment often have different specifications[…]
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An EMI cancellation system cancels electromagnetic interference (EMI) that degrades electron microscopes performance. Using a sensor, controller, and field canceling loops, the EMI cancellation system measures the ambient magnetic field at the electron beam column and then generates an equal and opposite field thereby eliminates EMI that would[…]
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DC and AC magnetic fields create electromagnetic interference (EMI) that can degrade the performance of electron microscopes and e-beam lithography tools. Although AC and DC magnetic fields are related, each impacts equipment differently. There are different strategies to mitigate both, but an AC+DC active magnetic field cancelation system is[…]
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Low-frequency and high-frequency vibration both have a significant impact on electron microscopy laboratories and high-tech manufacturing facilities. These two types of vibration stem from different causes and the strategy for mitigating vibration for each is also different. Vibration Engineering Consultants (VEC) can help you quantify and[…]
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When purchasing or moving a new electron microscope or process tool, customers have a few options when it comes to deciding who should provide their site survey. The original equipment manufacturer (OEM) will often offer the survey, and organizations sometimes attempt to conduct the survey themselves in-house. In this post, we will discuss the[…]
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Overview: Changes in DC magnetic field levels near an electron microscope or e-beam lithography tool degrade image quality and inhibit production. A change in DC fields often results in image distortion, a blurred image, or image drift. Common sources of change in DC magnetic fields are variation in the Earth’s magnetic field and the movement of[…]
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