An EMI cancellation system cancels electromagnetic interference (EMI) that degrades electron microscopes performance. Using a sensor, controller, and field canceling loops, the EMI cancellation

DC and AC magnetic fields create electromagnetic interference (EMI) that can degrade the performance of electron microscopes and e-beam lithography tools. Although AC and DC magnetic fields are related, each impacts equipment differently.

Low-frequency and high-frequency vibration both have a significant impact on electron microscopy laboratories and high-tech manufacturing facilities. These two types of vibration stem from different causes and the strategy for mitigating vibration for each is also different

When purchasing or moving a new electron microscope or process tool, customers have a few options when it comes to deciding who should provide their site survey. The original equipment manufacturer (OEM) will often offer the survey, and organizations sometimes attempt to conduct the survey themselves in-house. In this post,

Changes in DC magnetic field levels near an electron microscope or e-beam lithography tool degrade image quality and inhibit production. A change in DC fields often results in image distortion, a blurred image, or image drift

A site survey for an electron microscope, analytical equipment, or a sensitive manufacturing tool is a critical requirement whenever purchasing a piece of equipment or moving into a new laboratory or cleanroom.